Semiconductor Equipment Inventory (II)

[allwin21]

33 ELECTROGLAS EG 2001 Prober The 2000 series wafer probers are controlled and operated through the use of two consoles (the operator’s console and the monitor console), simple push-button controls on each indexer (cassette handling platform), and basic camera illumination controls on the front of the power module.
34 Refurbished EG 1034 The ELECTROGLAS 1034X is designed for operational simplicity and fast wafer throughput. The unique ELECTROGLAS solid-state high-speed X-Y Positioning System permits simplified wafer loading and unloading outside the probe ring area with high-speed travel to and from the load position.
35 Refurbished ELECTROGLAS HORIZON 4085X Manufacturer:Electro¬nGlas, Condition:Used and good condition, Amount: 12 sets
36 EG 2010 The ELECTROGLAS 2010 wafer probers are extremely accurate, modularly designed automatic wafer probers, configured to perform automatic system functions of:
37 Rucker and Kolls Model 260J Probing Station Rucker and Kolls Model 260J Probing Station which is designed for critical manual probing. It incorporates a standard 4" chuck, X-Y positioning, theta adjustment and dual z-motion control handles (left and right).
38 SIGNATONE S-250 Probe Manfacturer:Signaton¬e.Condition:Used and Good Condition, complete, working condition.Amount:¬ 1 set, SIGNATONE S-250 WAFER INSPECTION PROBE / MICROMANIPULATOR
39 HP 4062UX The HP4062UX Semiconductor Process Control System is the high-end system of the HP4062 Semiconductor Parametric Test System family. The HP4062UX satisfies all of the requirements of the Integrated Circuit Manufacturers for both process monitoring and process development.
40 Refurbished HP 4145B HP4145B Semiconductor Parameter Analyzer
41 Temptronic TP03500/TP3000 Manufacturer:Temptro¬nic Corporation;Model:TP¬03500, Condition:New;Model¬ :TP3000, Hot chuck,6 inch, New
42 Refurbished MP 2020 The Wentworth MP2020 is a semi-automatic prober of laboratory and industrial production line to measure PCM parameter, the chuck which used for different temperature tests can be heated or colded (such as liquid nitrogen).The electrical engineering controls a microscope, make operation of left and right(X), front and back(Y) and up and down(Z) in convenience. Moreover the Z of microscope has two files, so that the operation of shield only on the constitution with probe card under the microscope of block plank is convenience.
43 HP 4142B The HP 4142B Modular DC Source/MonitorOfferi¬ng a wide measurement range and excellent sensitivity, the HP 4142B modular dc source/monitor is a system-use dc measurement instrument especially designed for high-throughput dc semiconductor testers.
44 HP/Agilent E5250A Low Leakage Switch Mainframe HP/Agilent E5250A Low Leakage Switch Mainframe
45 HP/Agilent E5252A For measuring a sequence of many devices on a test structure, the HP/Agilent E5252A (or E5250A option 001) crosspoint matrix module option provides the ideal solution.
46 Keithley 7002 Switch System The Model 7002 Switch System is a 10-slot mainframe that supports up to 400 2-pole multiplexer channels or 400 matrix crosspoints. The front panel includes a unique interactive display of channel status for quick programming.Scanning¬ speeds of up to 165 channels per second are possible with the high density switch cards.
47 HP 436A HP436A Power Meter without sensor
48 Keithley 7001 Switch System The Model 7001 is a half-rack, high density, two-slot mainframe that supports the widest range of signals in the test and measurement industry. DC switching capabilities from nanovolts to 1100V and femtoamps to 5A, as well as RF and optical switch support, make the Model 7001 a versatile production test tool for a wide array of applications.
49 HP 437B HP437B Power Meter without sensor
50 HP 4085B The HP 4085B switching matrix in the HP 4062UX Process Controll System produces a 1 pA, 1 mV switching system capable of 48(96)-pin high-resolution semiconductor testing.
51 HP 16067A low leakage fixtrue low leakage fixtrue, leads cable from HP4085B to prober station,2x24pin
52 HP 16075A relay test adaptor HP16075A relay test adaptor, calibrator of HP4085B
53 HP 16069A universal low leakage fixture HP16069 A universal low leakage fixture, leads cable from HP4085B to prober station
54 HP 16071A universal fixture HP 16071 A universal fixture, leads cable from HP4085B to prober station
55 HP 16076A HP16076A system test module, calibrator of HP4085B
56 HP 16077A extention cable fixture HP16077A extention cable fixture
57 HP 16346B HP 16346B , system calibration module, calibrator of HP4085B
58 HP 4284A Precision LCR Meter HP/Agilent 4284A Precision LCR Meter(20Hz-10MHz), Utilize state-of-the art measurement technologies
59 HP 16058A The Model 16058A Test Fixture is designed for use with the HP 4145A/B Semiconductor Parameter Analyzer.
60 FTG-12 FTG-12, It isnot tested or refurbished.It is sold*AS-IS WHERE IS*.Allwin21accepts¬ no responsibility or liability for the use and/or functionality of the system
61 in2 Series Manipulators in2 Series Manipulators For Smaller Test Heads.The Perfect Size for Your Smaller Test Heads .The stand alone in2 design has been scaled into three product groups, based on the load that needs to be supported. The column size (6", 8", 12") reflects the width of the I-Beam used in the design of the manipulator column
62 Tencor/ KLA-Tencor M-Gage 300 Refurbished Tencor/KLA-Tencor M-Gage 300 without printer.; Non-Contact Wafer Monitor for Sheet resistance.
63 Hitachi FE-SEM model S-4700 A Cold Field Emission Gun Scanning Electron Microscope (FEGSEM) of "below-the-lens" design capable of (manufacturer's claims) 1.5 nm resolution at 15 kV, 12 mm W.D.; and 2.5 nm resolution at 1 k, 2.5 mm W.D. Magnification ranges from 30X to 500,000X.
64 Hitachi S-4500 SEM Cold Field Emission SEM System Model: S-4500 SEM; Field Emission Scanning Electron Microscope (FE-SEM)
65 Hitachi S8840 Scanning Electron Microscope Manufacturer: Hitachi;Model: S8840
66 Hitachi S-8820 CD SEM Model:S-8820 or S-8620
67 LEO FE-SEM model 982 The LEO 982 Field emission scanning electron microscope (FE-SEM, Carl Zeiss SMT Inc. One Corporation Way Peabody, MA 01960) provides a means to achieve ultra high resolution images in the secondary emissive mode.
68 Hitachi FE-SEM model S-4160 6 inch full wafer system for in-process inspection and metrology of photoresist, e-beam resist, and nanolithographic structures: Semi-clean contamination level, No Au or Nobel metals allowed. Field emission gun with resolution to ~35 angstoms typical. On-board CD measurement and metrology functions. EDX Noran Instruments X-Ray Microanalysis system is controlled by a high-performance workstation with easy-to-use window manager
69 Micrion FIB model M9500 The Micrion 9500 is a highly sophisticated Focused Ion Beam System and is capable of performing very delicate microsurgery and cross-sectioning.
70 Ultrapointe Laser Imaging System 1010A KLA Tencor Ultrapointe Laser Imaging System 1010A
71 Tencor Thin Film Monitor TF-1 Tencor Thin Film Monitor TF-1, Price:$4,500.00, AS IS, WHERE IS, Advanced Payment.
72 NESLAB HX-300 Chiller NESLAB Air Cooled Digital Recirculating Chiller. Air Cooled Compressor. Temperature Range: 5 deg. C to 35 deg. C. Cooling Capacity: 34100 BTU/hr. at 20 deg. C. CP-55 Pump: 10 gpm at 40 psi. Reservoir Volume: 15 Gal. 440/480V., 3 Ph., 60 Hz. 12.1A
73 STS 310 PECVD STS 310 PECVD (Plasmafab PF310) Deposition System comprises of a Power Supply Console, the Deposition main frame and the Monitor trolley complete with keyboard.
74 NESLAB HX-300 NESLABHX-300Air Cooled Digital Recirculating Chiller. Air Cooled Compressor. Temperature Range: 5 deg. C to 35 deg. C. Cooling Capacity: 34100 BTU/hr. at 20 deg. C. CP-55 Pump: 10 gpm at 40 psi. Reservoir Volume: 15 Gal. 440/480V., 3 Ph., 60 Hz. 12.1A.
75 STS 320 RIE STS 320 RIE(MULTIPLEX RIE) is a manually load-lock batch plasma Etch system, designed for Research & Development and small scale production. The wafer platen can accommodate a variety of substrate sizes from 50mm up to 200 mm.
76 Plasma Therm VII 70 Series Manufacturer:Plasma¬ Therm Inc.Condition:Used,¬ good condition, complete Vintage:12/26/1990¬ SN:PTI-7698F-(01)
77 STS 320 ICP STS Multiplex ICP Process Module
78 Flammable Liquid Storage Cabinet Justrite's industry-leading product offering includes items specifically designed to help workers store, transfer, use and dispose of hazardous materials in a safe and convenient manner. These products can be categorized into several areas; fire prevention safety products and environmental protection/hazmat¬ products.
79 Automatic Voltage Regulator 095-1734 Staco Energy Products Co.'s voltage regulators are designed with maximum safety, ease of installation and efficiency in mind. Each model features a modular design, front accessibility and an enclosed, indoor, ventilated, drip-proof enclosure.
80 Automatic Voltage Regulator 095-1678 Staco Energy Products Co.'s voltage regulators are designed with maximum safety, ease of installation and efficiency in mind. Each model features a modular design, front accessibility and an enclosed, indoor, ventilated, drip-proof enclosure.
81 Dynatex DX-III Scriber/Breaker Dynatex DX-III Scriber/Breaker
82 WaferDemount AW 750 WaferDemount AW 750,
83 Thermocarbon Dicing Saw 8003 The Thermocarbon ESEC Dicing Saw 8003 is a high performance, multi-processor, fully programmable, precision wafer dicing saw. Contact allwin21 for more information.

Peter Chen
Allwin21 Corp
www.allwin21.com
peterchen@allwin21.com
3521 Leonard Court Santa Clara, CA 95054,USA.
Tel.:              1-408-988-5188         1-408-988-5188
Fax:1-408-904-7168